Optical inspection approach for accelerated research of kesterite thin film photovoltaic devices

  • Rubio1 Robert-Fonoll (Vortragender)
  • Victoria Rotaru (Vortragender)
  • Jon Gari (Autor)
  • Jacob Andrade-Arvizu (Autor)
  • Ginner, L. (Vortragender)
  • Motschi, A. (Vortragender)
  • Pedro Vidal-Fuentes (Vortragender)
  • Alejandro Perez-Rodriguez (Autor)
  • Victor Izquierdo-Roca (Vortragender)
  • Maxim Guc (Vortragender)

Aktivität: Vortrag ohne Tagungsband / VorlesungPräsentation auf einer wissenschaftlichen Konferenz / Workshop

Beschreibung

The mass production of large-scale photovoltaic (PV) devices relies on emerging thin-film
materials and device architectures built upon stable, environmentally conscious resources.
Kesterite compounds like Cu2ZnSnSe4 (CZTSe) presents many advantages as an absorber
layer in thin-film PV devices such as stability, affordability (CRM-free), and adaptability to
flexible substrates. Its current record energy conversion efficiency (14.9% for
(Ag,Cu)2ZnSn(S1-xSex)4) together with easier possibility to tune the band gap energy in solid
solutions proves its potential for fast industrialization for diverse applications beyond
extensive solar farms, like Internet of things, indoor PV, building-integrated PV, vehicleintegrated
PV, or agrivoltaics. However, the use of multielement materials and multilayer
architectures results in a highly complex PV system that requires a holistic approach for its
research and optimization, meaning mainly involvement of statistically relevant number of
samples/cells/devices/measured points. Currently, holistic and statistically relevant
characterization strategies that yield simultaneous information from different layers of a
thin film PV device are barely used even at laboratory scale. On the one hand, this makes it
difficult to detect the impact of layers synthesis and device fabrication parameters on the
fundamental properties of the materials. On the other hand, this also complicates the direct
correlation of modifications in the fabrication parameters with the performance of the final
devices.
Zeitraum27 Juni 2024
EreignistitelEuropean Kesterite+ Workshop and 2nd RENEW-PV
VeranstaltungstypKonferenz
KonferenznummerID_37
OrtVerona, ItalienAuf Karte anzeigen
BekanntheitsgradInternational

Research Field

  • High-Performance Vision Systems

Schlagwörter

  • zero defect manufacturing
  • inline inspection