Beschreibung
The mass production of large-scale photovoltaic (PV) devices relies on emerging thin-filmmaterials and device architectures built upon stable, environmentally conscious resources.
Kesterite compounds like Cu2ZnSnSe4 (CZTSe) presents many advantages as an absorber
layer in thin-film PV devices such as stability, affordability (CRM-free), and adaptability to
flexible substrates. Its current record energy conversion efficiency (14.9% for
(Ag,Cu)2ZnSn(S1-xSex)4) together with easier possibility to tune the band gap energy in solid
solutions proves its potential for fast industrialization for diverse applications beyond
extensive solar farms, like Internet of things, indoor PV, building-integrated PV, vehicleintegrated
PV, or agrivoltaics. However, the use of multielement materials and multilayer
architectures results in a highly complex PV system that requires a holistic approach for its
research and optimization, meaning mainly involvement of statistically relevant number of
samples/cells/devices/measured points. Currently, holistic and statistically relevant
characterization strategies that yield simultaneous information from different layers of a
thin film PV device are barely used even at laboratory scale. On the one hand, this makes it
difficult to detect the impact of layers synthesis and device fabrication parameters on the
fundamental properties of the materials. On the other hand, this also complicates the direct
correlation of modifications in the fabrication parameters with the performance of the final
devices.
Zeitraum | 27 Juni 2024 |
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Ereignistitel | European Kesterite+ Workshop and 2nd RENEW-PV |
Veranstaltungstyp | Konferenz |
Konferenznummer | ID_37 |
Ort | Verona, ItalienAuf Karte anzeigen |
Bekanntheitsgrad | International |
Research Field
- High-Performance Vision Systems
Schlagwörter
- zero defect manufacturing
- inline inspection
Dokumente & Verweise
- Optical inspection approach for accelerated research of kesterite thin film photovoltaic devices (ID_37)
Datei: application/pdf, 56,7 KB
Typ: Text
Verbundene Inhalte
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Publikationen
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Optical inspection approach for in-line industrial monitoring of nano and micrometric layers quality in thin film photovoltaics technologies
Publikation: Posterpräsentation ohne Beitrag in Tagungsband › Posterpräsentation ohne Eintrag in Tagungsband › Begutachtung
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Aktivitäten
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Zero defect manufacturing for thin film photovoltaics
Aktivität: Vortrag ohne Tagungsband / Vorlesung › Vortrag auf einer Konferenz / einem Workshop für die Industrie oder eine öffentliche Einrichtung