Aktivität: Vortrag ohne Tagungsband / Vorlesung › Präsentation auf einer wissenschaftlichen Konferenz / Workshop
xposure:photometry, is AITs fast inline 3D surface scanner realized by a high-speed smart camera. It is designed for optical inline surface inspection tasks common in many industrial manufacturing processes. Conventional two-dimensional (2D) scanning methods cannot distinguish between pseudo defects due to dirt on the manufactured part's surface or on-prints on the one hand, and actual three-dimensional (3D)-defects at the surface of the material on the other hand, including small defects such as scratches, ridges, spikes, pinholes or wrinkles. At the same time, existing 3D inspection methods are not able to handle high speeds, i.e. high throughputs, neither for single objects nor for high transport speeds of endless material. xposure:photometry addresses this predicament by combining very fast photometric stereo (PS) imaging and smart camera technology to highlight actual small 3D defects at the object's surface, while distinguishing them from pseudo defects. To achieve separation of texture (Albedo) and structure (Gradient images) at typical speeds around e.g. 10m/s @ resolution of 50µm / px is made possible by fast photometric stereo processing directly inside the cameras FPGA.