Smart 3D Surface Inspection with xposure:photometry

Aktivität: Vortrag ohne Tagungsband / VorlesungPräsentation auf einer wissenschaftlichen Konferenz / Workshop

Beschreibung

xposure:photometry, is AIT’s fast inline 3D surface scanner realized by a high-speed smart camera. It is designed for optical inline surface inspection tasks common in many industrial manufacturing processes. Conventional two-dimensional (2D) scanning methods cannot distinguish between pseudo defects due to dirt on the manufactured part's surface or on-prints on the one hand, and actual three-dimensional (3D)-defects at the surface of the material on the other hand, including small defects such as scratches, ridges, spikes, pinholes or wrinkles. At the same time, existing 3D inspection methods are not able to handle high speeds, i.e. high throughputs, neither for single objects nor for high transport speeds of endless material. xposure:photometry addresses this predicament by combining very fast photometric stereo (PS) imaging and smart camera technology to highlight actual small 3D defects at the object's surface, while distinguishing them from pseudo defects. To achieve separation of texture (Albedo) and structure (Gradient images) at typical speeds around e.g. 10m/s @ resolution of 50µm / px is made possible by fast photometric stereo processing directly inside the camera’s FPGA.
Zeitraum4 Okt. 20225 Okt. 2022
EreignistitelScientific Vision Days 2022
VeranstaltungstypSonstiges
BekanntheitsgradInternational

Research Field

  • High-Performance Vision Systems

Schlagwörter

  • high-speed
  • surface defect detection
  • peaks
  • inline
  • holes
  • shape from shading
  • 2.5D
  • scratches
  • Photometric stereo
  • in-line