Calculation of Antenna Pattern Influence on Radiated Emission Measurement Uncertainty

Alexander Kriz

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Titel	IEEE International Symposium on Electromagnetic Compatibility
Seitenumfang	6
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	IEEE International Symposium on Electromagnetic Compatibility - Dauer: 18 Aug. 2008 → 22 Aug. 2008

Konferenz	IEEE International Symposium on Electromagnetic Compatibility
Zeitraum	18/08/08 → 22/08/08

Research Field

@inproceedings{56d0fd37787c4d68b8764410d0735733,

title = "Calculation of Antenna Pattern Influence on Radiated Emission Measurement Uncertainty",

author = "Alexander Kriz",

year = "2008",

language = "English",

isbn = "978-1-4244-1699-8",

booktitle = "IEEE International Symposium on Electromagnetic Compatibility",

note = "IEEE International Symposium on Electromagnetic Compatibility ; Conference date: 18-08-2008 Through 22-08-2008",

}

TY - GEN

T1 - Calculation of Antenna Pattern Influence on Radiated Emission Measurement Uncertainty

AU - Kriz, Alexander

PY - 2008

Y1 - 2008

M3 - Conference Proceedings with Oral Presentation

SN - 978-1-4244-1699-8

BT - IEEE International Symposium on Electromagnetic Compatibility

T2 - IEEE International Symposium on Electromagnetic Compatibility

Y2 - 18 August 2008 through 22 August 2008

ER -