Calculation of the H-Plane Pattern Influence to the Site VSWR Result using the Monte Carlo Method

Alexander Kriz, Wolfgang Muellner

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Titel	Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility
Seitenumfang	6
Publikationsstatus	Veröffentlicht - 2007
Veranstaltung	2007 IEEE International Symposium on Electromagnetic Compatibility - Dauer: 1 Jan. 2007 → …

Konferenz	2007 IEEE International Symposium on Electromagnetic Compatibility
Zeitraum	1/01/07 → …

Research Field

@inproceedings{3712f004e1fe4ca9ba3faef1bd7b8b76,

title = "Calculation of the H-Plane Pattern Influence to the Site VSWR Result using the Monte Carlo Method",

author = "Alexander Kriz and Wolfgang Muellner",

year = "2007",

language = "English",

isbn = "1-4244-1350-8",

booktitle = "Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility",

note = "2007 IEEE International Symposium on Electromagnetic Compatibility ; Conference date: 01-01-2007",

}

TY - GEN

T1 - Calculation of the H-Plane Pattern Influence to the Site VSWR Result using the Monte Carlo Method

AU - Kriz, Alexander

AU - Muellner, Wolfgang

PY - 2007

Y1 - 2007

M3 - Conference Proceedings with Oral Presentation

SN - 1-4244-1350-8

BT - Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility

T2 - 2007 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 1 January 2007

ER -