Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components

Publikation: Posterpräsentation ohne Beitrag in Tagungsband › Posterpräsentation ohne Eintrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2020
Veranstaltung	NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference - Dauer: 1 Dez. 2020 → 8 Dez. 2020

Konferenz	NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference
Zeitraum	1/12/20 → 8/12/20

Research Field

@conference{507f4b368ff84362aa3ebc8bd6cc567c,

title = "Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components",

author = "Christoph Tscherne and Michael Wind and Marcin Latocha and Peter Beck",

year = "2020",

language = "English",

note = "NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference ; Conference date: 01-12-2020 Through 08-12-2020",

}

Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components. / Tscherne, Christoph; Wind, Michael; Latocha, Marcin et al.
2020. Beitrag in NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference.

Publikation: Posterpräsentation ohne Beitrag in Tagungsband › Posterpräsentation ohne Eintrag in Tagungsband › Begutachtung

TY - CONF

T1 - Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components

AU - Tscherne, Christoph

AU - Wind, Michael

AU - Latocha, Marcin

AU - Beck, Peter

PY - 2020

Y1 - 2020

M3 - Poster presentation without proceedings

T2 - NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference

Y2 - 1 December 2020 through 8 December 2020

ER -