Correlative Microscopy and Spectroscopy of Perovskite Thin Films: Degradation Analysis

V. Paraskeva; Rita Ebner; E. Peraticos; S. Pechmann; Tommaso Fontanot; Aranzazu Aguirre; T. Aernouts; A. Krishna; Maria Hadjipanayi; M. Sergides; A. Othonos; S. Christiansen; George E. Georghiou

doi:10.4229/EUPVSEC2023/2BV.2.45

Correlative Microscopy and Spectroscopy of Perovskite Thin Films: Degradation Analysis

Titel in Übersetzung: MIKROSKOPIE UND SPEKTROSKOPIE VON PEROWSKIT-DÜNNSCHICHTEN: DEGRADATIONSANALYSE

V. Paraskeva, Rita Ebner, E. Peraticos, S. Pechmann, Tommaso Fontanot, Aranzazu Aguirre, T. Aernouts, A. Krishna, Maria Hadjipanayi, M. Sergides, A. Othonos, S. Christiansen, George E. Georghiou

Energy Conversion & Hydrogen

Publikation: Beitrag in Buch oder Tagungsband › Beitrag in Tagungsband mit Posterpräsentation › Begutachtung

Abstract

Perowskit-Materialien haben aufgrund ihrer wünschenswerten photoelektrischen Eigenschaften hervorragende Aussichten für Halbleiteranwendungen. Die Morphologie und die Struktur der Lichtabsorptionsschicht sind von entscheidender Bedeutung für die Leistung des Geräts, und ihre Veränderungen während der Degradationsphase sind für das Verständnis der Degradationswege von größter Bedeutung. In dieser Arbeit wurden unberührte Perowskit-Dünnschichten mit und ohne FACl-Zusätze in der aktiven Perowskit-Schicht mit Rasterelektronenmikroskopie (SEM), Rasterkraftmikroskopie (AFM) und Energiedispersionsspektroskopie (EDX) charakterisiert, um Veränderungen der Perowskit-Korngröße, der Korngrenzen und der Stromdichten zu ermitteln. Darüber hinaus wurden Femtosekunden-Transmissionsmessungen eingesetzt, um Veränderungen in der Ladungsträgerrelaxationsdynamik in eingekapselten Perowskit-Dünnschichten vor und nach der Freibewitterung festzustellen.

Titel in Übersetzung	MIKROSKOPIE UND SPEKTROSKOPIE VON PEROWSKIT-DÜNNSCHICHTEN: DEGRADATIONSANALYSE
Originalsprache	Englisch
Titel	EU PVSEC Proceedings
Seitenumfang	5
ISBN (elektronisch)	2196-100X
DOIs	https://doi.org/10.4229/EUPVSEC2023/2BV.2.45
Publikationsstatus	Veröffentlicht - 18 Sept. 2023
Veranstaltung	40th EU PVSEC 2023 - Lisbon Congress Center, Lisbon, Portugal Dauer: 18 Sept. 2023 → 22 Sept. 2023

Konferenz

Konferenz	40th EU PVSEC 2023
Land/Gebiet	Portugal
Stadt	Lisbon
Zeitraum	18/09/23 → 22/09/23

Research Field

Energy Conversion and Hydrogen Technologies

Schlagwörter

Perovskites
Characterization
Aging
Spectroscopy
Microscopy

UN SDGs

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10.4229/EUPVSEC2023/2BV.2.45

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@inbook{b0ccafda57fe4fbe8bddea2d8935585f,

title = "Correlative Microscopy and Spectroscopy of Perovskite Thin Films: Degradation Analysis",

abstract = "Perovskite materials have excellent prospects for semiconducting applications due to their desirable photoelectric properties. The morphology and the structure of the light absorption layer are crucially important for the device performance and their changes through the degradation period are of upmost importance for understanding degradation pathways. In this work, pristine perovskite thin films with and without FACl additives in the active perovskite layer have been characterized with Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Energy-Dispersive Spectroscopy (EDX) to identify changes in the perovskite grain size, grain boundaries and current densities. Moreover, femtosecond transient transmission measurements have been employed to detect changes in carrier relaxation dynamics in encapsulated perovskite thin films before and after outdoor exposure.",

keywords = "Perovskites, Characterization, Aging, Spectroscopy, Microscopy, perovskites, microscopy, spectroscopy",

author = "V. Paraskeva and Rita Ebner and E. Peraticos and S. Pechmann and Tommaso Fontanot and Aranzazu Aguirre and T. Aernouts and A. Krishna and Maria Hadjipanayi and M. Sergides and A. Othonos and S. Christiansen and Georghiou, {George E.}",

year = "2023",

month = sep,

day = "18",

doi = "10.4229/EUPVSEC2023/2BV.2.45",

language = "English",

isbn = "3-936338-88-4",

booktitle = "EU PVSEC Proceedings",

note = "40th EU PVSEC 2023 ; Conference date: 18-09-2023 Through 22-09-2023",

}

Paraskeva, V, Ebner, R, Peraticos, E, Pechmann, S, Fontanot, T, Aguirre, A, Aernouts, T, Krishna, A, Hadjipanayi, M, Sergides, M, Othonos, A, Christiansen, S & Georghiou, GE 2023, Correlative Microscopy and Spectroscopy of Perovskite Thin Films: Degradation Analysis. in EU PVSEC Proceedings. 40th EU PVSEC 2023, Lisbon, Portugal, 18/09/23. https://doi.org/10.4229/EUPVSEC2023/2BV.2.45

TY - CHAP

T1 - Correlative Microscopy and Spectroscopy of Perovskite Thin Films: Degradation Analysis

AU - Paraskeva, V.

AU - Ebner, Rita

AU - Peraticos, E.

AU - Pechmann, S.

AU - Fontanot, Tommaso

AU - Aguirre, Aranzazu

AU - Aernouts, T.

AU - Krishna, A.

AU - Hadjipanayi, Maria

AU - Sergides, M.

AU - Othonos, A.

AU - Christiansen, S.

AU - Georghiou, George E.

PY - 2023/9/18

Y1 - 2023/9/18

N2 - Perovskite materials have excellent prospects for semiconducting applications due to their desirable photoelectric properties. The morphology and the structure of the light absorption layer are crucially important for the device performance and their changes through the degradation period are of upmost importance for understanding degradation pathways. In this work, pristine perovskite thin films with and without FACl additives in the active perovskite layer have been characterized with Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Energy-Dispersive Spectroscopy (EDX) to identify changes in the perovskite grain size, grain boundaries and current densities. Moreover, femtosecond transient transmission measurements have been employed to detect changes in carrier relaxation dynamics in encapsulated perovskite thin films before and after outdoor exposure.

AB - Perovskite materials have excellent prospects for semiconducting applications due to their desirable photoelectric properties. The morphology and the structure of the light absorption layer are crucially important for the device performance and their changes through the degradation period are of upmost importance for understanding degradation pathways. In this work, pristine perovskite thin films with and without FACl additives in the active perovskite layer have been characterized with Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Energy-Dispersive Spectroscopy (EDX) to identify changes in the perovskite grain size, grain boundaries and current densities. Moreover, femtosecond transient transmission measurements have been employed to detect changes in carrier relaxation dynamics in encapsulated perovskite thin films before and after outdoor exposure.

KW - Perovskites

KW - Characterization

KW - Aging

KW - Spectroscopy

KW - Microscopy

KW - perovskites

KW - microscopy

KW - spectroscopy

U2 - 10.4229/EUPVSEC2023/2BV.2.45

DO - 10.4229/EUPVSEC2023/2BV.2.45

M3 - Conference Proceedings with Poster Presentation

SN - 3-936338-88-4

BT - EU PVSEC Proceedings

T2 - 40th EU PVSEC 2023

Y2 - 18 September 2023 through 22 September 2023

ER -

Correlative Microscopy and Spectroscopy of Perovskite Thin Films: Degradation Analysis

Abstract

Konferenz

Research Field

Schlagwörter

UN SDGs

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