Defect analysis in ultrathin X-Si PV cells

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Titel	Photovoltaic Technical Conference 2017
Publikationsstatus	Veröffentlicht - 2017
Veranstaltung	Photovoltaic Technical Conference 2017 - Dauer: 26 Mai 2017 → 28 Mai 2017

Konferenz	Photovoltaic Technical Conference 2017
Zeitraum	26/05/17 → 28/05/17

Research Field

@inproceedings{cfd2fa7ffc684b399d3e0ddf4a9089ad,

title = "Defect analysis in ultrathin X-Si PV cells",

author = "Rita Ebner and Shokufeh Zamini and Gusztav Ujvari and Bernhard Kubicek and Martin Halwachs and P. Sommeling",

year = "2017",

language = "English",

booktitle = "Photovoltaic Technical Conference 2017",

note = "Photovoltaic Technical Conference 2017 ; Conference date: 26-05-2017 Through 28-05-2017",

}

TY - GEN

T1 - Defect analysis in ultrathin X-Si PV cells

AU - Zamini, Shokufeh

AU - Ujvari, Gusztav

AU - Kubicek, Bernhard

AU - Halwachs, Martin

AU - Sommeling, P.

A2 - Ebner, Rita

PY - 2017

Y1 - 2017

M3 - Conference Proceedings with Oral Presentation

BT - Photovoltaic Technical Conference 2017

T2 - Photovoltaic Technical Conference 2017

Y2 - 26 May 2017 through 28 May 2017

ER -