Examination of LV grid phenomena by means of PHIL testing

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Titel	38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)
Seiten	1-40
Seitenumfang	40
Publikationsstatus	Veröffentlicht - 2012
Veranstaltung	38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012) - Dauer: 25 Okt. 2012 → 28 Okt. 2012

Konferenz	38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)
Zeitraum	25/10/12 → 28/10/12

Research Field

@inproceedings{009a1d45bee8459c801da300b6d4ef5e,

title = "Examination of LV grid phenomena by means of PHIL testing",

author = "Georg Lauss and Felix Lehfuss and Benoit Bletterie and Thomas Strasser and Roland Br{\"u}ndlinger",

year = "2012",

language = "English",

isbn = "978-1-4673-2420-5",

pages = "1--40",

booktitle = "38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)",

note = "38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012) ; Conference date: 25-10-2012 Through 28-10-2012",

}

TY - GEN

T1 - Examination of LV grid phenomena by means of PHIL testing

AU - Lehfuss, Felix

AU - Bletterie, Benoit

AU - Strasser, Thomas

AU - Bründlinger, Roland

A2 - Lauss, Georg

PY - 2012

Y1 - 2012

M3 - Conference Proceedings with Oral Presentation

SN - 978-1-4673-2420-5

SP - 1

EP - 40

BT - 38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)

T2 - 38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)

Y2 - 25 October 2012 through 28 October 2012

ER -