Expressing Best Practices in (Risk) Analysis and Testing of Safety-Critical Systems Using Patterns

Wolfgang Herzner; Sven Sieverding; Omar Kacimi; Ackard Böde; Thomas Bauser; Brian Nielsen

doi:10.1109/ISSREW.2014.24

Expressing Best Practices in (Risk) Analysis and Testing of Safety-Critical Systems Using Patterns

Wolfgang Herzner, Sven Sieverding, Omar Kacimi (Vortragende:r), Ackard Böde, Thomas Bauser, Brian Nielsen

Aalborg University

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Titel	IEEE Computer Society Conference Publishing Services (CPS)
Seitenumfang	5
DOIs	https://doi.org/10.1109/ISSREW.2014.24
Publikationsstatus	Veröffentlicht - 2014
Veranstaltung	IEEE 25th International Symposium on Software Reliability Engineering - Second International Workshop on Risk Assessment and Risk-Driven Testing - Dauer: 3 Nov. 2014 → 6 Nov. 2014

Konferenz

Konferenz	IEEE 25th International Symposium on Software Reliability Engineering - Second International Workshop on Risk Assessment and Risk-Driven Testing
Zeitraum	3/11/14 → 6/11/14

Research Field

Ehemaliges Research Field - Digital Safety and Security

Zugriff auf Dokument

10.1109/ISSREW.2014.24Lizenz: Nicht angegeben

Diese Publikation zitieren

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title = "Expressing Best Practices in (Risk) Analysis and Testing of Safety-Critical Systems Using Patterns",

author = "Wolfgang Herzner and Sven Sieverding and Omar Kacimi and Ackard B{\"o}de and Thomas Bauser and Brian Nielsen",

year = "2014",

doi = "10.1109/ISSREW.2014.24",

language = "English",

booktitle = "IEEE Computer Society Conference Publishing Services (CPS)",

note = "IEEE 25th International Symposium on Software Reliability Engineering - Second International Workshop on Risk Assessment and Risk-Driven Testing ; Conference date: 03-11-2014 Through 06-11-2014",

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Herzner, W, Sieverding, S, Kacimi, O, Böde, A, Bauser, T & Nielsen, B 2014, Expressing Best Practices in (Risk) Analysis and Testing of Safety-Critical Systems Using Patterns. in IEEE Computer Society Conference Publishing Services (CPS). IEEE 25th International Symposium on Software Reliability Engineering - Second International Workshop on Risk Assessment and Risk-Driven Testing, 3/11/14. https://doi.org/10.1109/ISSREW.2014.24

TY - GEN

T1 - Expressing Best Practices in (Risk) Analysis and Testing of Safety-Critical Systems Using Patterns

AU - Herzner, Wolfgang

AU - Sieverding, Sven

AU - Böde, Ackard

AU - Bauser, Thomas

AU - Nielsen, Brian

A2 - Kacimi, Omar

PY - 2014

Y1 - 2014

U2 - 10.1109/ISSREW.2014.24

DO - 10.1109/ISSREW.2014.24

M3 - Conference Proceedings with presentation

BT - IEEE Computer Society Conference Publishing Services (CPS)

T2 - IEEE 25th International Symposium on Software Reliability Engineering - Second International Workshop on Risk Assessment and Risk-Driven Testing

Y2 - 3 November 2014 through 6 November 2014

ER -