Fast microscopic inline computational 3D imaging

Publikation: Posterpräsentation ohne Beitrag in TagungsbandPosterpräsentation ohne Eintrag in Tagungsband

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Inline inspection is becoming an essential tool for industrial high-quality production. The demand of fast acquisition speeds and high-precision 3D imaging are often at the limit of what is physically possible. Production environments often require strict optical specifications such as wide field of view at a high spatial and depth resolution, dealing with complex object material properties like dark, matt and shiny reflections. To address these challenges, we developed a machine vision system which evolves the AITs Inline Computational Imaging (ICI) technology enabling for simultaneous 2D & 3D inspection of moving parts at resolutions down to the μm-range. Our new ici:microscopy technology consists of an active light vision system which combines light field (LF) and photometric stereo imaging techniques (PS) into a single sensor solution and works largely independent from surface properties of the inspected matter. This enables for precise quality control in numerous industrial applications for challenging objects in production environment.
PublikationsstatusVeröffentlicht - 2023
VeranstaltungEMVA Forum 2023: 6th European Machine Vision Forum - Wageningen, Niederlande
Dauer: 12 Okt. 202313 Okt. 2023


KonferenzEMVA Forum 2023

Research Field

  • High-Performance Vision Systems


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