Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

Andreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg Weissenbacher

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Originalsprache	Englisch
Seitenumfang	1
Fachzeitschrift	ACM Transactions on Embedded Computing Systems
Volume	1
Issue	18
DOIs	https://doi.org/10.1145/3289256
Publikationsstatus	Veröffentlicht - 2019

Research Field

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T1 - Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

AU - Fellner, Andreas

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Tarrach, Thorsten

AU - Weissenbacher, Georg

PY - 2019

Y1 - 2019

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