PECVD SiN photonic integrated circuit for swept source OCT at 840 nm

Stefan Nevlacsil; P. Müllner; Alejandro Maese-Novo; Martin Sagmeister; J. Kraft; Elisabeth Rank; Wolfgang Drexler; Rainer Hainberger

PECVD SiN photonic integrated circuit for swept source OCT at 840 nm

Stefan Nevlacsil (Vortragende:r)
, P. Müllner
, Alejandro Maese-Novo
, Martin Sagmeister
, J. Kraft
, Elisabeth Rank
, Wolfgang Drexler
, Rainer Hainberger

Molecular Diagnostics

Publikation: Posterpräsentation ohne Beitrag in Tagungsband › Posterpräsentation ohne Eintrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2020
Veranstaltung	ECIO 2020 European Conference on Integrated Optics - Dauer: 23 Juni 2020 → 24 Juni 2020

Konferenz

Konferenz	ECIO 2020 European Conference on Integrated Optics
Zeitraum	23/06/20 → 24/06/20

Research Field

Molecular Diagnostics

Diese Publikation zitieren

@conference{9d1fe541243741e5aa4d7028d29b6fc7,

title = "PECVD SiN photonic integrated circuit for swept source OCT at 840 nm",

author = "Stefan Nevlacsil and P. M{\"u}llner and Alejandro Maese-Novo and Martin Sagmeister and J. Kraft and Elisabeth Rank and Wolfgang Drexler and Rainer Hainberger",

year = "2020",

language = "English",

note = "ECIO 2020 European Conference on Integrated Optics ; Conference date: 23-06-2020 Through 24-06-2020",

}

TY - CONF

T1 - PECVD SiN photonic integrated circuit for swept source OCT at 840 nm

AU - Müllner, P.

AU - Maese-Novo, Alejandro

AU - Sagmeister, Martin

AU - Kraft, J.

AU - Rank, Elisabeth

AU - Drexler, Wolfgang

AU - Hainberger, Rainer

A2 - Nevlacsil, Stefan

PY - 2020

Y1 - 2020

M3 - Poster presentation without proceedings

T2 - ECIO 2020 European Conference on Integrated Optics

Y2 - 23 June 2020 through 24 June 2020

ER -