Quality inspection of translucent and micro-structured functional surfaces

Nicole Brosch; Laurin Ginner; Sarah Anna Schneider; Doris Antensteiner; Lukas Traxler

doi:10.1117/12.2605273

Quality inspection of translucent and micro-structured functional surfaces

Nicole Brosch, Laurin Ginner, Sarah Anna Schneider, Doris Antensteiner (Vortragende:r), Lukas Traxler

High-Performance Vision Systems

Publikation: Beitrag in Buch oder Tagungsband › Beitrag in Tagungsband mit Posterpräsentation › Begutachtung

Originalsprache	Englisch
Titel	Proc. SPIE 12019, Al and Optical Data Sciences III
Seiten	173-184
Seitenumfang	12
DOIs	https://doi.org/10.1117/12.2605273
Publikationsstatus	Veröffentlicht - 2022
Veranstaltung	SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III - Dauer: 21 Feb. 2022 → 27 Feb. 2022

Konferenz

Konferenz	SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III
Zeitraum	21/02/22 → 27/02/22

Research Field

High-Performance Vision Systems

Zugriff auf Dokument

10.1117/12.2605273Lizenz: Nicht angegeben

1 Artikel

Evaluating Testing and Use of Photometric Stereo Applications for Riblet Inspection
Wotawa, F., Jahaj, L. & Brosch, N., 16 Dez. 2024, in: SN Computer Science. 6, 2, S. 1 16 S.
Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Open Access

Diese Publikation zitieren

@inbook{43d03e362fc142d99c7e43a6ad469627,

title = "Quality inspection of translucent and micro-structured functional surfaces",

author = "Nicole Brosch and Laurin Ginner and Schneider, {Sarah Anna} and Doris Antensteiner and Lukas Traxler",

year = "2022",

doi = "10.1117/12.2605273",

language = "English",

pages = "173--184",

booktitle = "Proc. SPIE 12019, Al and Optical Data Sciences III",

note = "SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III ; Conference date: 21-02-2022 Through 27-02-2022",

}

TY - CHAP

T1 - Quality inspection of translucent and micro-structured functional surfaces

AU - Brosch, Nicole

AU - Ginner, Laurin

AU - Schneider, Sarah Anna

AU - Traxler, Lukas

A2 - Antensteiner, Doris

PY - 2022

Y1 - 2022

U2 - 10.1117/12.2605273

DO - 10.1117/12.2605273

M3 - Conference Proceedings with Poster Presentation

SP - 173

EP - 184

BT - Proc. SPIE 12019, Al and Optical Data Sciences III

T2 - SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III

Y2 - 21 February 2022 through 27 February 2022

ER -

Quality inspection of translucent and micro-structured functional surfaces

Konferenz

Research Field

Zugriff auf Dokument

Publikationen

Evaluating Testing and Use of Photometric Stereo Applications for Riblet Inspection

Diese Publikation zitieren