Scanning Heterodyne Interferometer Setup for the Time-Resolved Thermal and Free Carrier Mapping in Semiconductor Devices

Martin Litzenberger, C. Fürböck, S. Bychinkhin, D. Pogany, Erich Gornik

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Originalsprache	Englisch
Seiten (von - bis)	2438-2445
Seitenumfang	8
Fachzeitschrift	IEEE Transactions on Instrumentation and Measurement
Publikationsstatus	Veröffentlicht - 2005

Research Field

@article{3f0dc7cbbef943528527d75437a75320,

title = "Scanning Heterodyne Interferometer Setup for the Time-Resolved Thermal and Free Carrier Mapping in Semiconductor Devices",

author = "Martin Litzenberger and C. F{\"u}rb{\"o}ck and S. Bychinkhin and D. Pogany and Erich Gornik",

year = "2005",

language = "English",

pages = "2438--2445",

journal = "IEEE Transactions on Instrumentation and Measurement",

issn = "0018-9456",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Scanning Heterodyne Interferometer Setup for the Time-Resolved Thermal and Free Carrier Mapping in Semiconductor Devices

AU - Litzenberger, Martin

AU - Fürböck, C.

AU - Bychinkhin, S.

AU - Pogany, D.

AU - Gornik, Erich

PY - 2005

Y1 - 2005

M3 - Article

SN - 0018-9456

SP - 2438

EP - 2445

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

ER -