Secondary ion emission from binary and ternary amorphous alloys

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband

Originalsprache	Englisch
Titel	3. international conference on ion mass spectrometry (SIMS III).
Seiten	282-287
Seitenumfang	6
Publikationsstatus	Veröffentlicht - 1982
Veranstaltung	3. international conference on ion mass spectrometry (SIMS III). - Dauer: 1 Jan. 1982 → …

Konferenz	3. international conference on ion mass spectrometry (SIMS III).
Zeitraum	1/01/82 → …

Research Field

@inproceedings{343a6c9052d54bc08d68a0e14c859163,

title = "Secondary ion emission from binary and ternary amorphous alloys",

keywords = "FZS-000PHP, FZS-000PHP",

author = "H. Gnaser and M. Riedel and J. Marton and Friedrich R{\"u}denauer",

year = "1982",

language = "English",

pages = "282--287",

booktitle = "3. international conference on ion mass spectrometry (SIMS III).",

note = "3. international conference on ion mass spectrometry (SIMS III). ; Conference date: 01-01-1982",

}

TY - GEN

T1 - Secondary ion emission from binary and ternary amorphous alloys

AU - Gnaser, H.

AU - Riedel, M.

AU - Marton, J.

AU - Rüdenauer, Friedrich

PY - 1982

Y1 - 1982

KW - FZS-000PHP

M3 - Conference Proceedings with Oral Presentation

SP - 282

EP - 287

BT - 3. international conference on ion mass spectrometry (SIMS III).

T2 - 3. international conference on ion mass spectrometry (SIMS III).

Y2 - 1 January 1982

ER -