Structural and electrical characterization of SiO2/MgO(001) barriers on Si for a magnetic MOSFET device

A. Kohn, A Kovacs, T. Uhrmann, Theodoros Dimopoulos, H. Brückl

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Research Field

@article{5687472b5ae4464ba365fb2c34882c44,

title = "Structural and electrical characterization of SiO2/MgO(001) barriers on Si for a magnetic MOSFET device",

author = "A. Kohn and A Kovacs and T. Uhrmann and Theodoros Dimopoulos and H. Br{\"u}ckl",

year = "2009",

language = "English",

volume = "95",

pages = "42506",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}