X-Ray Profile Analysis of Severely Plastically Deformed Titanium

Erhard Schafler, Leonhard Zeipper, Michael Zehetbauer

Publikation: Beitrag in Buch oder Tagungsband › Vortrag mit Beitrag in Tagungsband › Begutachtung

Originalsprache	Englisch
Titel	2nd Int. Conference on Nanomaterials by Severe Plastic Deformation
Seiten	426-432
Seitenumfang	7
Publikationsstatus	Veröffentlicht - 2004
Veranstaltung	2nd Int. Conference on Nanomaterials by Severe Plastic Deformation - Dauer: 1 Jan. 2004 → …

Konferenz	2nd Int. Conference on Nanomaterials by Severe Plastic Deformation
Zeitraum	1/01/04 → …

Research Field

@inproceedings{9dd31cf65c5c40e58067145a2d1df744,

title = "X-Ray Profile Analysis of Severely Plastically Deformed Titanium",

author = "Erhard Schafler and Leonhard Zeipper and Michael Zehetbauer",

year = "2004",

language = "English",

pages = "426--432",

booktitle = "2nd Int. Conference on Nanomaterials by Severe Plastic Deformation",

note = "2nd Int. Conference on Nanomaterials by Severe Plastic Deformation ; Conference date: 01-01-2004",

}

TY - GEN

T1 - X-Ray Profile Analysis of Severely Plastically Deformed Titanium

AU - Schafler, Erhard

AU - Zeipper, Leonhard

AU - Zehetbauer, Michael

PY - 2004

Y1 - 2004

M3 - Conference Proceedings with Oral Presentation

SP - 426

EP - 432

BT - 2nd Int. Conference on Nanomaterials by Severe Plastic Deformation

T2 - 2nd Int. Conference on Nanomaterials by Severe Plastic Deformation

Y2 - 1 January 2004

ER -