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AMT 2.0 - Monitoring Tool for Extended STL Specifications

  • Olivier Lebeltel (Author)
  • Oded Maler (Author)
  • Nickovic, D. (Speaker)

    Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop

    Period21 Jul 2017 → 22 Jul 2017
    Event titleFAC'17
    Event typeOther
    Degree of RecognitionInternational

    Research Field

    • Not defined