Research output
- 1 Poster presentation without proceedings
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Optical inspection approach for in-line industrial monitoring of nano and micrometric layers quality in thin film photovoltaics technologies
Robert-Fonoll , R. (Speaker), Rotaru, V., Lilley, R. G. M., Ginner, L., Motschi, A., Vidal-Fuentes1, P., Paetel, S., Stanik, K., Wojciechowski, K., Spinelli, P., Becerril-Romero, I., Izquierdo-Roca, V. & Guc, M., 27 Sept 2024.Research output: Poster presentation without proceedings › peer-review
Activities
- 1 Presentation at a scientific conference / workshop
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Optical inspection approach for accelerated research of kesterite thin film photovoltaic devices
Robert-Fonoll , R. (Speaker), Rotaru, V. (Speaker), Gari, J. (Author), Andrade-Arvizu, J. (Author), Ginner, L. (Speaker), Motschi, A. (Speaker), Vidal-Fuentes, P. (Speaker), Perez-Rodriguez, A. (Author), Izquierdo-Roca, V. (Speaker) & Guc, M. (Speaker)
27 Jun 2024Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop
File