Christian Kapeller

Fast Inline photometric stereo using coherent illumination and multi-TDI speckle reduction
Kapeller, C., Ginner, L., Bodenstorfer, E. & Traxler, L. (Speaker), 2022, Proc. SPIE 11983, High-Power Diode Laser Technology XX. p. 231-243 13 p.
Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Poster Presentation › peer-review
Industry-fit AI Usage for Crack Detection in Ground Steel
Soukup, D., Kapeller, C., Raml, B. & Ruisz, J., 2022, In: ELECTRONICS. p. 1-13 13 p.
Research output: Contribution to journal › Article › peer-review
Photometric stereo-based high-speed inline battery electrode inspection
Kapeller, C. & Bodenstorfer, E., 2021, In: tm- Technisches Messen. 88, p. 423-432 10 p.
Research output: Contribution to journal › Article › peer-review
Inline battery foil inspection using strobed Photometric Stereo
Kapeller, C. (Speaker), Blaschitz, B. & Bodenstorfer, E., 2020, Forum Bildverarbeitung 2020. Society for Imaging Science and Technology, 13 p.
Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation

Open Access
Modulares Ringlicht für photometrische Analyse von Mikrostrukturoberflächen
Haider, A. (Speaker), Traxler, L., Brosch, N. & Kapeller, C., 2020, Forum Bildverarbeitung 2020. Society for Imaging Science and Technology, p. 39-48 10 p.
Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation

Open Access

Battery foil inspection with inline-photometry and AI
Schneider, P. (Speaker), Kapeller, C. (Author) & Bodenstorfer, E. (Author)
4 Oct 2022 → 6 Oct 2022
Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop
Smart 3D Surface Inspection with xposure:photometry
Bodenstorfer, E. (Speaker), Schurek, P. (Author), Hasani, Y. (Author) & Kapeller, C. (Author)
4 Oct 2022 → 5 Oct 2022
Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop
Responsible Introduction of AI in Industrial Inspection Processes
Kapeller, C. (Speaker), Soukup, D. (Author) & Ruisz, J. (Author)
4 Oct 2022 → 6 Oct 2022
Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop
Torwards full-area defect inspection in battery electrodes
Kapeller, C. (Speaker)
5 Oct 2021 → 7 Oct 2021
Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop
xposure: photometry- fast inline 3D surface scanner
Bodenstorfer, E. (Speaker), Schurek, P. (Author), Hasani, Y. (Author) & Kapeller, C. (Author)
5 Oct 2021 → 7 Oct 2021
Activity: Talk or presentation / Lecture › Presentation at a scientific conference / workshop

Inline microscopic 3D shape reconstruction
Antensteiner, Doris (Recipient), Kapeller, Christian (Recipient), Mecca, Roberto (Recipient) & Traxler, Lukas (Recipient), 17 Oct 2023
Prize: Prize/Award › Best paper award in journal / conference

Research output