A dynamic model of power metal-oxide-semiconductor field-effect transistor half-bridges for the fast simulation of switching induced electromagnetic emissions

Dominik Büchl, Wolfgang Kemmetmüller, Tobias Glück, B. Deutschmann, Andreas Kugi

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)242-260
Number of pages19
JournalMathematical and Computer Modelling of Dynamical Systems
Issue number3
Publication statusPublished - 2019

Research Field

  • Complex Dynamical Systems

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