A Robust and Low Complexity Deep Learning Model for Remote Sensing Image Classification

Cam Le (Speaker, Invited), Lam Pham (Author, Invited), Nghia NVN (Author, Invited), Truong Nguyen (Author, Invited), Trang Le (Author, Invited)

Research output: Chapter in Book or Conference ProceedingsConference Proceedings with Oral Presentationpeer-review

Abstract

In this paper, we present a robust and low complexity deep learning model for Remote Sensing Image Classification (RSIC), the task of identifying the scene of a remote sensing image. In particular, we firstly evaluate different low complexity and benchmark deep neural networks: MobileNetV1, MobileNetV2, NASNetMobile, and EfficientNetB0, which present the number of trainable parameters lower than 5 Million (M). After indicating best network architecture, we further improve the network performance by applying attention schemes to multiple feature maps extracted from middle layers of the network. To deal with the issue of increasing the model footprint as using attention schemes, we apply the quantization technique to satisfy the maximum of 20 MB memory occupation. By conducting extensive experiments on the benchmark datasets NWPU-RESISC45, we achieve a robust and low-complexity model, which is very competitive to the state-of-the-art systems and potential for real-life applications on edge devices.
Original languageEnglish
Title of host publication8th International Conference on Intelligent Information Technology (ICIIT 2023)
Pages1-8
Number of pages8
Publication statusPublished - 13 Jul 2023
EventCIIT 2023: 2023 8th International Conference on Intelligent Information Technology - Da Nang, Viet Nam
Duration: 24 Feb 202326 Feb 2023

Publication series

NameProceedings of the 2023 8th International Conference on Intelligent Information Technology

Conference

ConferenceCIIT 2023: 2023 8th International Conference on Intelligent Information Technology
Country/TerritoryViet Nam
CityDa Nang
Period24/02/2326/02/23

Research Field

  • Former Research Field - Data Science

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