An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair

Erwin Schoitsch; N. Suri

An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair

Erwin Schoitsch (Speaker)
, N. Suri

Assistive & Autonomous Systems

TU Darmstadt, Institut WAR, Darmstadt

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation

Original language	English
Title of host publication	Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50
Pages	298-299
Number of pages	2
Publication status	Published - 2008
Event	Informationstagung Mikroelektronik 08 - Duration: 15 Oct 2008 → 16 Oct 2008

Conference

Conference	Informationstagung Mikroelektronik 08
Period	15/10/08 → 16/10/08

Research Field

Not defined

Cite this

Schoitsch, E., & Suri, N. (2008). An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair. In Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50 (pp. 298-299)

Schoitsch, Erwin ; Suri, N. / An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair. Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50. 2008. pp. 298-299

@inproceedings{52aad091b7a0461fb9d84a6659d74d99,

title = "An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session {"}Embedded Systems - Dependability: Validation, Verification, Certification{"}, Abstract und Geleitwort als Session Chair",

author = "Erwin Schoitsch and N. Suri",

year = "2008",

language = "English",

isbn = "978-3-85133-049-6",

pages = "298--299",

booktitle = "Tagungsband zur Informationstagung Mikroelektronik 08, {\"O}VE Schriftenreihe Nr. 50",

note = "Informationstagung Mikroelektronik 08 ; Conference date: 15-10-2008 Through 16-10-2008",

}

Schoitsch, E & Suri, N 2008, An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair. in Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50. pp. 298-299, Informationstagung Mikroelektronik 08, 15/10/08.

An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair. / Schoitsch, Erwin (Speaker); Suri, N.
Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50. 2008. p. 298-299.

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation

TY - GEN

T1 - An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair

AU - Suri, N.

A2 - Schoitsch, Erwin

PY - 2008

Y1 - 2008

M3 - Conference Proceedings with Oral Presentation

SN - 978-3-85133-049-6

SP - 298

EP - 299

BT - Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50

T2 - Informationstagung Mikroelektronik 08

Y2 - 15 October 2008 through 16 October 2008

ER -

Schoitsch E, Suri N. An Abstract on Trustable Systems Validation, Verification and Certification - Challenges through Resilience Requirements. Key Note zur Session "Embedded Systems - Dependability: Validation, Verification, Certification", Abstract und Geleitwort als Session Chair. In Tagungsband zur Informationstagung Mikroelektronik 08, ÖVE Schriftenreihe Nr. 50. 2008. p. 298-299