Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components

Christoph Tscherne, Michael Wind, Marcin Latocha, Peter Beck

Research output: Poster presentation without proceedings › peer-review

Original language	English
Publication status	Published - 2020
Event	NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference - Duration: 1 Dec 2020 → 8 Dec 2020

Conference	NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference
Period	1/12/20 → 8/12/20

Research Field

@conference{507f4b368ff84362aa3ebc8bd6cc567c,

title = "Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components",

author = "Christoph Tscherne and Michael Wind and Marcin Latocha and Peter Beck",

year = "2020",

language = "English",

note = "NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference ; Conference date: 01-12-2020 Through 08-12-2020",

}

TY - CONF

T1 - Characterization of a Certified Exposure Facility for Total Ionizing Dose Testing of Electronic Components

AU - Tscherne, Christoph

AU - Wind, Michael

AU - Latocha, Marcin

AU - Beck, Peter

PY - 2020

Y1 - 2020

M3 - Poster presentation without proceedings

T2 - NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference

Y2 - 1 December 2020 through 8 December 2020

ER -