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Depth and all-in-focus images obtained by multi-line-scan light-field approach

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original languageEnglish
Title of host publicationProceedings of SPIE-IS&T Electronic Imaging - Image Processing: Machine Vision Applications VII
PublisherSPIE
Number of pages16
ISBN (Print)978-0-8194-9941-7
Publication statusPublished - 2014
EventSPIE-IS&T Electronic Imaging - Image Processing: Machine Vision Applications VII -
Duration: 2 Feb 2014 → 6 Feb 2014

Conference

ConferenceSPIE-IS&T Electronic Imaging - Image Processing: Machine Vision Applications VII
Period2/02/14 → 6/02/14

Research Field

  • Former Research Field - Digital Safety and Security

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