Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease

Heinrich Garn; Markus Waser; Manfred Deistler; Thomas Benke; Peter Dal-Bianco; Gerhard Ransmayr; Helena Schmidt; Günter Sanin; Peter Santer; Georg Caravias; Stephan Seiler; Dieter Grossegger; Wolfgang Frühwirt; Reinhold Schmidt

Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease

Heinrich Garn (Speaker)
, Markus Waser
, Manfred Deistler
, Thomas Benke
, Peter Dal-Bianco
, Gerhard Ransmayr
, Helena Schmidt
, Günter Sanin
, Peter Santer
, Georg Caravias
, Stephan Seiler
, Dieter Grossegger
, Wolfgang Frühwirt
, Reinhold Schmidt

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original language	English
Title of host publication	IEEE International Conference on Biomedical and Health Informatics
Pages	496-499
Number of pages	4
Publication status	Published - 2014
Event	IEEE International Conference on Biomedical and Health Informatics - Duration: 1 Jun 2014 → 4 Jun 2014

Conference

Conference	IEEE International Conference on Biomedical and Health Informatics
Period	1/06/14 → 4/06/14

Research Field

Former Research Field - Digital Safety and Security

Cite this

Garn, H., Waser, M., Deistler, M., Benke, T., Dal-Bianco, P., Ransmayr, G., Schmidt, H., Sanin, G., Santer, P., Caravias, G., Seiler, S., Grossegger, D., Frühwirt, W., & Schmidt, R. (2014). Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease. In IEEE International Conference on Biomedical and Health Informatics (pp. 496-499)

@inproceedings{fff917f42ae8486280cfd365fa2c8cf5,

title = "Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease",

author = "Heinrich Garn and Markus Waser and Manfred Deistler and Thomas Benke and Peter Dal-Bianco and Gerhard Ransmayr and Helena Schmidt and G{\"u}nter Sanin and Peter Santer and Georg Caravias and Stephan Seiler and Dieter Grossegger and Wolfgang Fr{\"u}hwirt and Reinhold Schmidt",

year = "2014",

language = "English",

isbn = "978-1-4799-2131-7",

pages = "496--499",

booktitle = "IEEE International Conference on Biomedical and Health Informatics",

note = "IEEE International Conference on Biomedical and Health Informatics ; Conference date: 01-06-2014 Through 04-06-2014",

}

Garn, H, Waser, M, Deistler, M, Benke, T, Dal-Bianco, P, Ransmayr, G, Schmidt, H, Sanin, G, Santer, P, Caravias, G, Seiler, S, Grossegger, D, Frühwirt, W & Schmidt, R 2014, Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease. in IEEE International Conference on Biomedical and Health Informatics. pp. 496-499, IEEE International Conference on Biomedical and Health Informatics, 1/06/14.

Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease. / Garn, Heinrich (Speaker); Waser, Markus; Deistler, Manfred et al.
IEEE International Conference on Biomedical and Health Informatics. 2014. p. 496-499.

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

TY - GEN

T1 - Electroencephalographic Complexity Markers Explain Neuropsychological Test Scores in Alzheimer's Disease

AU - Waser, Markus

AU - Deistler, Manfred

AU - Benke, Thomas

AU - Dal-Bianco, Peter

AU - Ransmayr, Gerhard

AU - Schmidt, Helena

AU - Sanin, Günter

AU - Santer, Peter

AU - Caravias, Georg

AU - Seiler, Stephan

AU - Grossegger, Dieter

AU - Frühwirt, Wolfgang

AU - Schmidt, Reinhold

A2 - Garn, Heinrich

PY - 2014

Y1 - 2014

M3 - Conference Proceedings with Oral Presentation

SN - 978-1-4799-2131-7

SP - 496

EP - 499

BT - IEEE International Conference on Biomedical and Health Informatics

T2 - IEEE International Conference on Biomedical and Health Informatics

Y2 - 1 June 2014 through 4 June 2014

ER -