Embedded Contours Extraction for High-Speed Scene Dynamics Based on a Neuromorphic Temporal Contrast Vision Sensor

Ahmed Nabil Belbachir, Michael Hofstätter, Nenad Milosevic, Peter Schön

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original language	English
Title of host publication	Workshop Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition
Number of pages	8
Publication status	Published - 2008
Event	IEEE Embedded Computer Vision Workshop - Duration: 23 Jun 2008 → 28 Jun 2008

Conference	IEEE Embedded Computer Vision Workshop
Period	23/06/08 → 28/06/08

Research Field

@inproceedings{20f333127bd744b7980b04ee6f6b76d1,

title = "Embedded Contours Extraction for High-Speed Scene Dynamics Based on a Neuromorphic Temporal Contrast Vision Sensor",

author = "Belbachir, {Ahmed Nabil} and Michael Hofst{\"a}tter and Nenad Milosevic and Peter Sch{\"o}n",

year = "2008",

language = "English",

isbn = "978-1-4244-2340-8",

booktitle = "Workshop Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition",

note = "IEEE Embedded Computer Vision Workshop ; Conference date: 23-06-2008 Through 28-06-2008",

}

Embedded Contours Extraction for High-Speed Scene Dynamics Based on a Neuromorphic Temporal Contrast Vision Sensor. / Belbachir, Ahmed Nabil; Hofstätter, Michael; Milosevic, Nenad et al.
Workshop Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition. 2008.

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

TY - GEN

T1 - Embedded Contours Extraction for High-Speed Scene Dynamics Based on a Neuromorphic Temporal Contrast Vision Sensor

AU - Belbachir, Ahmed Nabil

AU - Hofstätter, Michael

AU - Milosevic, Nenad

AU - Schön, Peter

PY - 2008

Y1 - 2008

M3 - Conference Proceedings with Oral Presentation

SN - 978-1-4244-2340-8

BT - Workshop Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition

T2 - IEEE Embedded Computer Vision Workshop

Y2 - 23 June 2008 through 28 June 2008

ER -