Examination of LV grid phenomena by means of PHIL testing

Georg Lauss (Speaker), Felix Lehfuss, Benoit Bletterie, Thomas Strasser, Roland Bründlinger

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original language	English
Title of host publication	38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)
Pages	1-40
Number of pages	40
Publication status	Published - 2012
Event	38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012) - Duration: 25 Oct 2012 → 28 Oct 2012

Conference	38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)
Period	25/10/12 → 28/10/12

Research Field

@inproceedings{009a1d45bee8459c801da300b6d4ef5e,

title = "Examination of LV grid phenomena by means of PHIL testing",

author = "Georg Lauss and Felix Lehfuss and Benoit Bletterie and Thomas Strasser and Roland Br{\"u}ndlinger",

year = "2012",

language = "English",

isbn = "978-1-4673-2420-5",

pages = "1--40",

booktitle = "38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)",

note = "38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012) ; Conference date: 25-10-2012 Through 28-10-2012",

}

TY - GEN

T1 - Examination of LV grid phenomena by means of PHIL testing

AU - Lehfuss, Felix

AU - Bletterie, Benoit

AU - Strasser, Thomas

AU - Bründlinger, Roland

A2 - Lauss, Georg

PY - 2012

Y1 - 2012

M3 - Conference Proceedings with Oral Presentation

SN - 978-1-4673-2420-5

SP - 1

EP - 40

BT - 38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)

T2 - 38th Annual Conference on IEEE Industrial Electronics Society (IECON 2012)

Y2 - 25 October 2012 through 28 October 2012

ER -