Investigation of potential induced degradation (PID) of solar modules from different manufacturers

Michael Schwark, Karl Berger, Rita Ebner, Christina Hirschl, Lukas Neumaier, Wolfgang Mühleisen

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original language	English
Title of host publication	Proceedings of the IECON 2013
Publication status	Published - 2013
Event	39th Annual Conference of the IEEE Industrial Electronics Society (IECON 2013) - Duration: 10 Nov 2013 → 13 Nov 2013

Conference	39th Annual Conference of the IEEE Industrial Electronics Society (IECON 2013)
Period	10/11/13 → 13/11/13

Research Field

@inproceedings{d72792a3aa1849e3a7b6db0cf470997e,

title = "Investigation of potential induced degradation (PID) of solar modules from different manufacturers",

author = "Michael Schwark and Karl Berger and Rita Ebner and Christina Hirschl and Lukas Neumaier and Wolfgang M{\"u}hleisen",

year = "2013",

language = "English",

isbn = "978-1-4799-0223-1",

booktitle = "Proceedings of the IECON 2013",

note = "39th Annual Conference of the IEEE Industrial Electronics Society (IECON 2013) ; Conference date: 10-11-2013 Through 13-11-2013",

}

TY - GEN

T1 - Investigation of potential induced degradation (PID) of solar modules from different manufacturers

AU - Schwark, Michael

AU - Berger, Karl

AU - Ebner, Rita

AU - Hirschl, Christina

AU - Neumaier, Lukas

AU - Mühleisen, Wolfgang

PY - 2013

Y1 - 2013

M3 - Conference Proceedings with Oral Presentation

SN - 978-1-4799-0223-1

BT - Proceedings of the IECON 2013

T2 - 39th Annual Conference of the IEEE Industrial Electronics Society (IECON 2013)

Y2 - 10 November 2013 through 13 November 2013

ER -