"Measurement of mechanical properties of electronic materials at temperatures down to 4.2 K"

Markus Fink, Thomas Fabing, Michael Scheerer, Ernst Semerad, B.D. Dunn

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)497-510
    Number of pages14
    JournalCryogenics
    Publication statusPublished - 2008

    Research Field

    • Not defined

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