Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

Andreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg Weissenbacher

Research output: Contribution to journal › Article › peer-review

Original language	English
Number of pages	1
Journal	ACM Transactions on Embedded Computing Systems
Volume	1
Issue number	18
DOIs	https://doi.org/10.1145/3289256
Publication status	Published - 2019

Research Field

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title = "Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search",

author = "Andreas Fellner and Willibald Krenn and Rupert Schlick and Thorsten Tarrach and Georg Weissenbacher",

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T1 - Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

AU - Fellner, Andreas

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Tarrach, Thorsten

AU - Weissenbacher, Georg

PY - 2019

Y1 - 2019

U2 - 10.1145/3289256

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JO - ACM Transactions on Embedded Computing Systems

JF - ACM Transactions on Embedded Computing Systems

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