Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

Research output: Contribution to journal › Article › peer-review

Original language	English
Number of pages	1
Journal	ACM Transactions on Embedded Computing Systems
Volume	1
Issue number	18
DOIs	https://doi.org/10.1145/3289256
Publication status	Published - 2019

Research Field

@article{eca4555cfaa143aca3cee8e573d1c74d,

title = "Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search",

author = "Andreas Fellner and Willibald Krenn and Rupert Schlick and Thorsten Tarrach and Georg Weissenbacher",

year = "2019",

doi = "10.1145/3289256",

language = "English",

volume = "1",

journal = "ACM Transactions on Embedded Computing Systems",

issn = "1539-9087",

publisher = "Association for Computing Machinery",

number = "18",

}

TY - JOUR

T1 - Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

AU - Fellner, Andreas

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Tarrach, Thorsten

AU - Weissenbacher, Georg

PY - 2019

Y1 - 2019

U2 - 10.1145/3289256

DO - 10.1145/3289256

M3 - Article

SN - 1539-9087

VL - 1

JO - ACM Transactions on Embedded Computing Systems

JF - ACM Transactions on Embedded Computing Systems

IS - 18

ER -