Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard K. Aichernig; Jakob Auer; Elisabeth Jöbstl; Robert Korosec; Willibald Krenn; Rupert Schlick; Birgit Vera Schmidt

Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard K. Aichernig (Speaker)
, Jakob Auer
, Elisabeth Jöbstl
, Robert Korosec
, Willibald Krenn
, Rupert Schlick
, Birgit Vera Schmidt

Graz University of Technology
AVL List GmbH

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original language	English
Title of host publication	Tests and Proofs 8th International Conference
Publisher	Springer
Number of pages	19
ISBN (Print)	978-3-319-09098-6
Publication status	Published - 2014
Event	8th International Conference on Tests & Proofs - Duration: 24 Jul 2014 → 25 Jul 2014

Conference

Conference	8th International Conference on Tests & Proofs
Period	24/07/14 → 25/07/14

Research Field

Former Research Field - Digital Safety and Security

Cite this

@inproceedings{724ddd0f48a34b89a6cd03e52f40b73a,

title = "Model-Based Mutation Testing of an Industrial Measurement Device",

author = "Aichernig, \{Bernhard K.\} and Jakob Auer and Elisabeth J{\"o}bstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Schmidt, \{Birgit Vera\}",

year = "2014",

language = "English",

isbn = "978-3-319-09098-6",

booktitle = "Tests and Proofs 8th International Conference",

publisher = "Springer",

address = "Germany",

note = "8th International Conference on Tests \& Proofs ; Conference date: 24-07-2014 Through 25-07-2014",

}

TY - GEN

T1 - Model-Based Mutation Testing of an Industrial Measurement Device

AU - Auer, Jakob

AU - Jöbstl, Elisabeth

AU - Korosec, Robert

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Schmidt, Birgit Vera

A2 - Aichernig, Bernhard K.

PY - 2014

Y1 - 2014

M3 - Conference Proceedings with Oral Presentation

SN - 978-3-319-09098-6

BT - Tests and Proofs 8th International Conference

PB - Springer

T2 - 8th International Conference on Tests & Proofs

Y2 - 24 July 2014 through 25 July 2014

ER -