Optical Characterization of Different Thin Film Module Technologies

Rita Ebner; Bernhard Kubicek; Gusztav Ujvari; Sabrina Novalin; Marcus Rennhofer; Martin Halwachs

doi:10.1155/2015/159458

Optical Characterization of Different Thin Film Module Technologies

Rita Ebner, Bernhard Kubicek, Gusztav Ujvari, Sabrina Novalin, Marcus Rennhofer, Martin Halwachs

Energy Conversion & Hydrogen

Research output: Contribution to journal › Article › peer-review

Abstract

For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.

Original language	English
Pages (from-to)	1-12
Number of pages	12
Journal	International Journal of Photoenergy
DOIs	https://doi.org/10.1155/2015/159458
Publication status	Published - 2015

Research Field

Former Research Field - Energy

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title = "Optical Characterization of Different Thin Film Module Technologies",

abstract = "For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.",

author = "Rita Ebner and Bernhard Kubicek and Gusztav Ujvari and Sabrina Novalin and Marcus Rennhofer and Martin Halwachs",

year = "2015",

doi = "10.1155/2015/159458",

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journal = "International Journal of Photoenergy",

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T1 - Optical Characterization of Different Thin Film Module Technologies

AU - Ebner, Rita

AU - Kubicek, Bernhard

AU - Ujvari, Gusztav

AU - Novalin, Sabrina

AU - Rennhofer, Marcus

AU - Halwachs, Martin

PY - 2015

Y1 - 2015

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AB - For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.

U2 - 10.1155/2015/159458

DO - 10.1155/2015/159458

M3 - Article

SN - 1110-662X

SP - 1

EP - 12

JO - International Journal of Photoenergy

JF - International Journal of Photoenergy

ER -

Optical Characterization of Different Thin Film Module Technologies

Abstract

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