Order dynamics of full scale photovoltaic devices under thermal treatment and electrical bias.

Standardized testings of crystalline silicon terrestrial photovoltaic devices are
important both for manufacturers and consumers and a key to reduce financial
risks and module failures. This qualification is important to examine the
impact of various stresses, such as electrical, thermal and mechanical, on the
power output and lifetime of the photovoltaic systems. The aim of the present
work was to study the performance stability of two photovoltaic modules with
different crystalline silicon cell technologies, passivated emitter and rear cell
and heterojunction, under various stabilization methods, including light- and
elevated temperature-induced degradation, rapid annealing, light soaking and
dark bias stabilization. Moreover, the impact of different current injection values
on the ordering states of stabilization processes is presented and discussed.