Quality inspection of translucent and micro-structured functional surfaces

Nicole Brosch; Laurin Ginner; Sarah Anna Schneider; Doris Antensteiner; Lukas Traxler

doi:10.1117/12.2605273

Quality inspection of translucent and micro-structured functional surfaces

Nicole Brosch, Laurin Ginner, Sarah Anna Schneider, Doris Antensteiner (Speaker), Lukas Traxler

High-Performance Vision Systems

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Poster Presentation › peer-review

Original language	English
Title of host publication	Proc. SPIE 12019, Al and Optical Data Sciences III
Pages	173-184
Number of pages	12
DOIs	https://doi.org/10.1117/12.2605273
Publication status	Published - 2022
Event	SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III - Duration: 21 Feb 2022 → 27 Feb 2022

Conference

Conference	SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III
Period	21/02/22 → 27/02/22

Research Field

High-Performance Vision Systems

Access to Document

10.1117/12.2605273Licence: Unspecified

1 Article

Evaluating Testing and Use of Photometric Stereo Applications for Riblet Inspection
Wotawa, F., Jahaj, L. & Brosch, N., 16 Dec 2024, In: SN Computer Science. 6, 2, p. 1 16 p.
Research output: Contribution to journal › Article › peer-review

Open Access

Cite this

@inbook{43d03e362fc142d99c7e43a6ad469627,

title = "Quality inspection of translucent and micro-structured functional surfaces",

author = "Nicole Brosch and Laurin Ginner and Schneider, {Sarah Anna} and Doris Antensteiner and Lukas Traxler",

year = "2022",

doi = "10.1117/12.2605273",

language = "English",

pages = "173--184",

booktitle = "Proc. SPIE 12019, Al and Optical Data Sciences III",

note = "SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III ; Conference date: 21-02-2022 Through 27-02-2022",

}

TY - CHAP

T1 - Quality inspection of translucent and micro-structured functional surfaces

AU - Brosch, Nicole

AU - Ginner, Laurin

AU - Schneider, Sarah Anna

AU - Traxler, Lukas

A2 - Antensteiner, Doris

PY - 2022

Y1 - 2022

U2 - 10.1117/12.2605273

DO - 10.1117/12.2605273

M3 - Conference Proceedings with Poster Presentation

SP - 173

EP - 184

BT - Proc. SPIE 12019, Al and Optical Data Sciences III

T2 - SPIE Photonics West OPTO 2022, AI and Optical Data Sciences III

Y2 - 21 February 2022 through 27 February 2022

ER -

Quality inspection of translucent and micro-structured functional surfaces

Conference

Research Field

Access to Document

Research output

Evaluating Testing and Use of Photometric Stereo Applications for Riblet Inspection

Cite this