Should I Sample it or Not? Improving Quality Assurance Efficiency Through Smart Active Sampling

Clemens Heistracher (Author and Speaker), Pedro Casas-Hernandez, Stefan Stricker, Axel Weißenfeld, Daniel Schall, Jana Kemnitz

Research output: Chapter in Book or Conference ProceedingsConference Proceedings with Oral Presentationpeer-review

Abstract

The digital transformation provides industries with unparalleled opportunities for value creation. AI and Machine learning (AI/ML)-driven approaches for data analysis applied to the massive amounts of data steaming from industrial processes can lead to enhanced operation, costs reduction, and powerful decision-making strategies. In this paper we address the problem of Quality Assurance (QA) in industrial manufacturing. We propose Smart Active Sampling (SAS), a new QA sampling strategy for quality inspection outside the production line. Based on the principles of active learning, an AI/ML model trained for quality prediction decides which produced pieces or samples are sent to quality inspection, to further improve its own prediction accuracy. SAS reduces the production of scrap parts due to earlier detection of quality violations. By inspecting a much lower number of samples as compared to traditional random sampling approaches, SAS improves QA efficiency and cuts down quality inspection costs, resulting in an overall smoother operation. We elaborate on some of the challenges faced in smart sampling strategies for quality inspection, describe the main concepts behind SAS, and showcase its application in a real-world manufacturing QA use case, training an AI/ML model for product defect prediction. Compared to a standard random sampling strategy, widely applied today in industrial QA applications, SAS improves model prediction accuracy requiring a significantly lower number of inspected samples, up to five time less samples in the analyzed dataset.
Original languageEnglish
Title of host publicationIECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
Pages1-6
Number of pages6
ISBN (Electronic)979-8-3503-3182-0
DOIs
Publication statusPublished - 16 Nov 2023
EventIECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society - Singapore, Singapore, Singapore
Duration: 16 Oct 202319 Oct 2023

Conference

ConferenceIECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
Country/TerritorySingapore
CitySingapore
Period16/10/2319/10/23

Research Field

  • Former Research Field - Data Science

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