Sputter redeposition as a limit to spatially 3-dimensional SIMS microanalysis

  • Friedrich Rüdenauer

    Research output: Contribution to journal › Article

    Original languageGerman
    Pages (from-to)115-124
    Number of pages10
    JournalUltramicroscopy(1988)
    Publication statusPublished - 1988

    Research Field

    • Not defined

    Keywords

    • FZS-000IPP

    Cite this