Systematic simulations to determine the impact of the sensor cross-section of the measuring probe on the exposure assessment in highly localized magnetic fields

Pia Schneeweiß; Gernot Schmid

Systematic simulations to determine the impact of the sensor cross-section of the measuring probe on the exposure assessment in highly localized magnetic fields

Pia Schneeweiß (Author and Speaker)
, Gernot Schmid

EMC & Optics

Research output: Poster presentation without proceedings

Original language	English
Publication status	Published - 2023
Event	BioEM 2023 - Oxford, United Kingdom Duration: 18 Jun 2023 → 23 Jun 2023

Conference

Conference	BioEM 2023
Country/Territory	United Kingdom
City	Oxford
Period	18/06/23 → 23/06/23

Research Field

Seibersdorf Laboratories

Cite this

@conference{3b2e023378c24ec0ad5f7ae155d27156,

title = "Systematic simulations to determine the impact of the sensor cross-section of the measuring probe on the exposure assessment in highly localized magnetic fields",

author = "Pia Schneewei{\ss} and Gernot Schmid",

year = "2023",

language = "English",

note = "BioEM 2023 ; Conference date: 18-06-2023 Through 23-06-2023",

}