TEM study on the diffusion process of Si/NiFe Schottky barrier and Si/MgO/NiFe tunneling diode

Lee Jehyun, Josef Fidler, T. Uhrmann, Theodoros Dimopoulos, H. Brückl

Research output: Chapter in Book or Conference ProceedingsConference Proceedings with Poster Presentation

Original languageEnglish
Title of host publicationMC2009
Publication statusPublished - 2009
EventMC2009 -
Duration: 30 Aug 20094 Sept 2009



Research Field

  • Former Research Field - Energy
  • Former Research Field - Health and Bioresources

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