Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography

Christoph Schmidt; F. Altmann; Giorgio Cataldo Mutinati; E. Brunet; S. Steinhauer; A. Köck; M. Siegele; C. Gamauf; A. Nemecek; J. Teva; J. Kraft; J. Siegert; F Schrank; H. Kruschke

Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography

Christoph Schmidt (Speaker)
, F. Altmann
, Giorgio Cataldo Mutinati
, E. Brunet
, S. Steinhauer
, A. Köck
, M. Siegele
, C. Gamauf
, A. Nemecek
, J. Teva
, J. Kraft
, J. Siegert
, F Schrank
, H. Kruschke

Molecular Diagnostics

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Poster Presentation › peer-review

Original language	English
Title of host publication	ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis
Pages	592-595
Number of pages	4
Publication status	Published - 2012
Event	ISTFA 2012 - Duration: 11 Nov 2012 → 15 Nov 2012

Conference

Conference	ISTFA 2012
Period	11/11/12 → 15/11/12

Research Field

Former Research Field - Health and Bioresources

Cite this

Schmidt, C., Altmann, F., Mutinati, G. C., Brunet, E., Steinhauer, S., Köck, A., Siegele, M., Gamauf, C., Nemecek, A., Teva, J., Kraft, J., Siegert, J., Schrank, F., & Kruschke, H. (2012). Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography. In ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis (pp. 592-595)

@inbook{480ad6d09a5c4300a737df55043ce412,

title = "Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography",

author = "Christoph Schmidt and F. Altmann and Mutinati, \{Giorgio Cataldo\} and E. Brunet and S. Steinhauer and A. K{\"o}ck and M. Siegele and C. Gamauf and A. Nemecek and J. Teva and J. Kraft and J. Siegert and F Schrank and H. Kruschke",

year = "2012",

language = "English",

pages = "592--595",

booktitle = "ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis",

note = "ISTFA 2012 ; Conference date: 11-11-2012 Through 15-11-2012",

}

Schmidt, C, Altmann, F, Mutinati, GC, Brunet, E, Steinhauer, S, Köck, A, Siegele, M, Gamauf, C, Nemecek, A, Teva, J, Kraft, J, Siegert, J, Schrank, F & Kruschke, H 2012, Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography. in ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. pp. 592-595, ISTFA 2012, 11/11/12.

Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography. / Schmidt, Christoph (Speaker); Altmann, F.; Mutinati, Giorgio Cataldo et al.
ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. 2012. p. 592-595.

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Poster Presentation › peer-review

TY - CHAP

T1 - Thermal Investigations on CMOS Integrated Micro-hot-plates Using IR Thermography

AU - Altmann, F.

AU - Mutinati, Giorgio Cataldo

AU - Brunet, E.

AU - Steinhauer, S.

AU - Köck, A.

AU - Siegele, M.

AU - Gamauf, C.

AU - Nemecek, A.

AU - Teva, J.

AU - Kraft, J.

AU - Siegert, J.

AU - Schrank, F

AU - Kruschke, H.

A2 - Schmidt, Christoph

PY - 2012

Y1 - 2012

M3 - Conference Proceedings with Poster Presentation

SP - 592

EP - 595

BT - ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis

T2 - ISTFA 2012

Y2 - 11 November 2012 through 15 November 2012

ER -