Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy

Research output: Chapter in Book or Conference Proceedings › Conference Proceedings with Oral Presentation › peer-review

Original language	English
Title of host publication	Scale Space and Variational Methods in Computer Vision
Pages	491-502
Number of pages	12
Publication status	Published - 2021
Event	International Conference on Scale Space and Variational Methods in Computer Vision (SSVM) - Duration: 17 May 2021 → 20 May 2021

Conference	International Conference on Scale Space and Variational Methods in Computer Vision (SSVM)
Period	17/05/21 → 20/05/21

Research Field

@inproceedings{c6c23ad86c5f47ebb2c8afc41ab5a1b4,

title = "Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy",

author = "Thomas Pinetz and Erich Kobler and Christian Doberstein and Benjamin Berkels and Alexander Effland",

year = "2021",

language = "English",

isbn = "978-3-030-75548-5",

pages = "491--502",

booktitle = "Scale Space and Variational Methods in Computer Vision",

note = "International Conference on Scale Space and Variational Methods in Computer Vision (SSVM) ; Conference date: 17-05-2021 Through 20-05-2021",

}

TY - GEN

T1 - Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy

AU - Kobler, Erich

AU - Doberstein, Christian

AU - Berkels, Benjamin

AU - Effland, Alexander

A2 - Pinetz, Thomas

PY - 2021

Y1 - 2021

M3 - Conference Proceedings with Oral Presentation

SN - 978-3-030-75548-5

SP - 491

EP - 502

BT - Scale Space and Variational Methods in Computer Vision

T2 - International Conference on Scale Space and Variational Methods in Computer Vision (SSVM)

Y2 - 17 May 2021 through 20 May 2021

ER -