@inproceedings{e353e099fa8248bbbeb8395b8c8e3476,
title = "Ultra-Fast 2K Line-Scan Sensor for Industrial Inspection Applications",
author = "Olaf Schrey and Christian Nitta and Benjamin Bechen and Ernst Bodenstorfer and J{\"o}rg Brodersen and Konrad Mayer and Werner Brockherde",
year = "2015",
language = "English",
isbn = "978-1-6284-1691-6",
booktitle = "Proceedings of SPIE Optical Metrology 2015",
publisher = "SPIE",
address = "United States",
note = "SPIE Optical Metrology Conference ; Conference date: 22-06-2015 Through 25-06-2015",
}