Ultra-Fast 2K Line-Scan Sensor for Industrial Inspection Applications

Olaf Schrey (Speaker), Christian Nitta, Benjamin Bechen, Ernst Bodenstorfer, Jörg Brodersen, Konrad Mayer, Werner Brockherde

Research output: Chapter in Book or Conference ProceedingsConference Proceedings with Oral Presentationpeer-review

Original languageEnglish
Title of host publicationProceedings of SPIE Optical Metrology 2015
PublisherSPIE
Number of pages15
ISBN (Print)978-1-6284-1691-6
Publication statusPublished - 2015
EventSPIE Optical Metrology Conference -
Duration: 22 Jun 201525 Jun 2015

Conference

ConferenceSPIE Optical Metrology Conference
Period22/06/1525/06/15

Research Field

  • Former Research Field - Digital Safety and Security

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